Electron microscopy
Advanced combination of Scanning Electron Microscopes (SEM)
with large chambers, with ISO17025 accreditation on magnification and X-ray analysis
Field emission gun SEM from JEOL (7001F) and from Zeiss (Ultra 55 and SigmaVP)
Microscope with variable pressure microscope allows easier insulator characterization and in this equipment, in-situ mechanical testing devices (tensile and bending tests)
  With a combination of analysers

•    X-ray Energy dispersive (EDS), X-ray Wavelength dispersive (WDS) for elemental chemistry
•   Electron Back Scattered Diffraction (EBSD) for cristallographic identification

These tools allow:

• Local chemistry, size and shape semi-quantification
• Crystal structure and orientation
• Strain measurements